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電子顕微鏡を用いた半導体分析研究・技術開発職

東レ株式会社

  • STEM-EELS
  • STEM-CL
  • SEM-SXES

Company Info

Job Summary

STEM-EELS、STEM-CL、SEM-SXESなど各種分光法による先端半導体、ディスプレイデバイスの電子顕微鏡用試料作製、観察、結晶構造・組成・電子状態解析を行うための新規評価・解析技術の探索・開発に携わります。SEMなど電子顕微鏡に関する経験がある方が望ましいです。

Duties

電子顕微鏡を用いた半導体分析業務では、STEM-EELS、STEM-CL、SEM-SXESなど各種分光法による先端半導体、ディスプレイデバイスの電子顕微鏡用試料作製、および観察と解析を行います。また、単なる観察に留まらず、結晶構造・組成・電子状態解析を行うための新規評価・解析技術の探索・開発も行います。配属先は(株)東レリサーチセンター・形態科学研究部第1研究室で、最先端のTEM設備と経験豊富な技術スタッフと共に、高難度の受託分析評価を実施し、大学や国立研究所との共同研究なども積極的に実施します。

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電子顕微鏡を用いた半導体分析研究・技術開発職

東レ株式会社

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